论文和技术资料

H. Chen-Mayer[1], R. E. Tosh[1]
[1]NIST, Gaithersburg, MD, USA

H. Chen-Mayer[1], R. E. Tosh[1]
[1]NIST, Gaithersburg, MD, USA

Y. Davletshin[1], J. C. Kumaradas[1]
[1]Ryerson University, Toronto, ON, Canada

S. Musa[1], M. N. O. Sadiku[1]
[1]Prairie View A&M University, Prairie View, TX, USA

G. Sowa[1], R. Paul[1], R. Smith[1]
[1]GrafTech International Inc., Parma, OH, USA

I. Mantilla[1], S. De Vicente[2]
[1]National University of Engineering, Lima, Perú
[2]Polytechnic University of Madrid, Madrid, Spain

P. K. Jain[1], D. Wang[1], J. D. Freels[1]
[1]Oak Ridge National Laboratory, Oak Ridge, TN, USA

R. W. Pryor[1]
[1]Pryor Knowledge Systems, Inc., Bloomfield Hills, MI, USA

W. H. Lee[1], K. Jensen[1]
[1]Massachusetts Institute of Technology, Cambridge, MA, USA

G. Escamez[1], C. Lorin[1], T. Wu[1], P. J. Masson[1]
[1]University of Houston, Houston, TX, USA